QL-SpectraVision NIR Scientific NIR/SWIR Camera product image - QuakeLogic Datasheet QL SpectraVision NIR 3

QL-SpectraVision NIR Scientific NIR/SWIR Camera

The QL-SpectraVision NIR is a scientific NIR/SWIR camera for imaging from 400 to 1700 nm. It combines a high-resolution InGaAs sensor, global shutter, thermoelectric cooling, USB 3.0 connectivity, and full-frame acquisition at 60 fps or higher. It is ideal for semiconductor inspection, optical metrology, machine vision, and laboratory research.

OVERVIEW

Description

Precision NIR and SWIR Imaging

The QuakeLogic QL-SpectraVision NIR is a high-performance scientific imaging camera. This model is an advanced scientific NIR/SWIR camera, covering visible, near-infrared, and short-wave infrared wavelengths.

Its broad spectral response extends from 400 to 1700 nm. Therefore, one camera can support both visible and SWIR imaging tasks.

The system is suitable for:

  • Semiconductor inspection
  • Optical metrology
  • Machine vision
  • Scientific research
  • Industrial inspection
  • Laboratory imaging
  • Automated optical systems

High-Resolution InGaAs Sensor

The camera uses a scientific-grade InGaAs area-scan sensor. It provides an effective resolution of 2560 × 2048 pixels or higher.

This high resolution reveals small details in samples and manufactured parts. In addition, it supports accurate measurement and inspection.

The sensor offers more than 30% quantum efficiency across 400–1600 nm. As a result, it provides strong signal capture across visible and SWIR wavelengths.

Broad 400–1700 nm Spectral Range

The QL-SpectraVision NIR covers a wide spectral range with one compact system.

This broad response supports imaging tasks that standard visible cameras cannot perform. It can reveal material properties, internal features, and spectral differences that may not appear under visible light.

Moreover, the broad range reduces the need for several separate imaging instruments.

Global Shutter Imaging

The global shutter exposes every pixel at the same time. Therefore, the camera can capture moving objects without rolling-shutter distortion.

This feature is useful for:

  • High-speed inspection
  • Conveyor applications
  • Machine vision
  • Motion analysis
  • Optical measurement
  • Automated production lines

The result is sharper geometry and more reliable measurements.

Thermoelectric Sensor Cooling

The camera includes thermoelectric sensor cooling. Its closed-loop control keeps the sensor near the selected temperature setpoint.

Cooling helps reduce dark noise during long exposures. It also improves image stability during repeated measurements.

As a result, the system delivers consistent imaging for low-light research and precision measurement.

High-Speed Image Acquisition

The QL-SpectraVision NIR captures full-frame images at 60 fps or higher with 8-bit output.

A high-speed image buffer supports continuous acquisition. Therefore, the camera can handle demanding inspection and research workflows.

Operators can also use a region of interest. This reduces the active image area and can improve acquisition efficiency.

Flexible Exposure and Trigger Control

The software-selectable exposure range extends from 25 µs to 2 seconds. Extended exposure is also supported for specialized imaging.

The camera offers:

  • Continuous free-running acquisition
  • External trigger acquisition
  • External TTL trigger input
  • Programmable trigger output
  • Software-controlled exposure
  • Software-configurable gain

These functions support synchronization with lights, motion systems, sensors, and other equipment.

12-Bit Image Digitization

The camera uses a 12-bit analog-to-digital converter. Users can select either 8-bit or 12-bit output.

The 12-bit mode provides greater tonal detail and dynamic range. Meanwhile, the 8-bit mode reduces data volume and supports faster workflows.

Therefore, operators can select the output format that best fits each application.

Built-In Image Correction

The QL-SpectraVision NIR includes several image-processing tools. These tools improve image quality and simplify system integration.

Built-in functions include:

  • Non-uniformity correction
  • Defective-pixel correction
  • Pixel binning
  • Region-of-interest selection
  • Adjustable image offset
  • Software gain control

These features reduce the need for extra image correction after acquisition.

USB 3.0 and Multi-OS Software

A high-speed USB 3.0 interface connects the camera to a computer. Image acquisition and live-view software are included.

The software development kit supports:

  • Windows
  • Linux
  • macOS

Therefore, users can integrate the camera into research software, inspection systems, and automated imaging platforms.

Compact Industrial Design

The camera uses a compact metal enclosure. Its housing measures less than 100 × 100 × 100 mm.

An industrial C-Mount interface supports a broad range of compatible lenses. In addition, a standard 1/4-20 thread allows stable mounting to optical benches, fixtures, and inspection rigs.

The factory-calibrated system also includes a DC power supply for U.S. AC systems. CE and FCC compliance is provided.

The datasheet specifies a high-resolution scientific InGaAs camera with 400–1700 nm sensitivity, thermoelectric cooling, global shutter acquisition, and USB 3.0 integration.

Technical Specifications

  • Camera type: Scientific NIR/SWIR camera
  • Sensor type: Scientific-grade 2D area-scan InGaAs
  • Effective resolution: 2560 × 2048 pixels or higher
  • Sensor size: 1 in (25.4 mm) or smaller
  • Shutter type: Global shutter
  • Spectral sensitivity: 400–1700 nm
  • Quantum efficiency: Greater than 30% across 400–1600 nm
  • Full-frame rate: 60 fps or higher at 8-bit output
  • ADC resolution: 12-bit
  • Output bit depth: Selectable 8-bit or 12-bit
  • Exposure range: 25 µs to 2 seconds
  • Extended exposure: Supported
  • Acquisition modes: Continuous free-run and external trigger
  • Trigger input: External TTL
  • Trigger output: Programmable external output
  • ROI: Pixel region-of-interest selection
  • Pixel binning: Supported
  • Image offset: Adjustable
  • Gain control: Software-configurable
  • Non-uniformity correction: Built-in
  • Defective-pixel correction: Built-in
  • Sensor cooling: Thermoelectric
  • Temperature control: Precision closed-loop regulation
  • Image buffer: High-speed continuous acquisition buffer
  • Computer interface: USB 3.0
  • Lens mount: Industrial C-Mount
  • Housing material: Compact metal enclosure
  • Housing dimensions: Less than 3.9 × 3.9 × 3.9 in
  • Metric housing dimensions: Less than 100 × 100 × 100 mm
  • Mounting thread: Standard 1/4-20
  • Software: Acquisition and live-view suite included
  • SDK support: Windows, Linux, and macOS
  • Power supply: DC supply for U.S. AC systems
  • Calibration: Factory-calibrated
  • Compliance: CE and FCC

Key Features

  • Scientific-grade NIR/SWIR imaging camera
  • High-resolution InGaAs area-scan sensor
  • 2560 × 2048 effective resolution or higher
  • 400–1700 nm spectral sensitivity
  • More than 30% quantum efficiency across 400–1600 nm
  • Global shutter architecture
  • Distortion-free motion capture
  • Full-frame acquisition at 60 fps or higher
  • Thermoelectric sensor cooling
  • Software-selectable cooling setpoint
  • Closed-loop temperature regulation
  • 12-bit analog-to-digital converter
  • Selectable 8-bit output
  • Selectable 12-bit output
  • Region-of-interest selection
  • Pixel binning
  • Image offset control
  • Software-configurable gain
  • Non-uniformity correction
  • Defective-pixel correction
  • High-speed image buffer
  • Continuous acquisition mode
  • External trigger mode
  • External TTL trigger input
  • Programmable trigger output
  • USB 3.0 interface
  • Industrial C-Mount lens interface
  • Standard 1/4-20 mounting thread
  • Compact metal enclosure
  • Acquisition and live-view software
  • Multi-platform software development kit
  • Factory-calibrated imaging system
  • DC power supply included
  • CE compliant
  • FCC compliant

Applications

  • Semiconductor wafer inspection
  • Semiconductor material analysis
  • Silicon inspection
  • Optical metrology
  • Machine vision
  • Automated optical inspection
  • SWIR imaging
  • Near-infrared imaging
  • Visible-to-SWIR imaging
  • Laboratory research
  • Scientific imaging
  • Spectral analysis
  • Material identification
  • Quality control
  • Industrial process monitoring
  • Electronics inspection
  • Solar-cell inspection
  • Laser-beam analysis
  • Low-light imaging
  • Optical system alignment
  • Microscope imaging
  • High-speed inspection
  • Conveyor inspection
  • Agricultural imaging
  • Pharmaceutical research
  • Biomedical research
  • Research and development

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