QuakeLogic QL-SpectraCore AmX – X-Ray Fluorescence (XRF) Spectrometer
High-performance EDXRF spectrometer for accurate elemental analysis from Carbon to Americium. Featuring fast SDD detection, ppm-level sensitivity, automated corrections, and turnkey laboratory deployment.
OVERVIEW
Description
The QL-SpectraCore AmX by QuakeLogic Inc. is a high-performance Energy Dispersive X-Ray Fluorescence (EDXRF) spectrometer. It is engineered for precise, repeatable elemental analysis in academic, research, and institutional laboratory environments.
Designed to support both routine quality control and advanced materials research, the QL-SpectraCore AmX delivers reliable qualitative, semi-quantitative, and quantitative analysis. It spans an exceptionally broad elemental range—from Carbon (C) through Americium (Am). Its ability to detect major, minor, and trace elements down to ppm levels makes it ideal for geochemistry, materials science, and environmental analysis. Moreover, it is suitable for metallurgy and rare earth element (REE) characterization.
At the core of the system is a fast Silicon Drift Detector (SDD) with Peltier cooling. This provides excellent energy resolution (~125 eV) and superior signal-to-noise performance without the need for external cooling. Additionally, advanced spectral processing, automated background and matrix corrections, and standardless Fundamental Parameter (FP) calibration ensure accurate results. All these features contribute to minimal method development.
The fully enclosed measurement chamber, integrated radiation shielding, and continuous X-ray emission monitoring ensure safe operation. Compliance with laboratory safety standards is achieved. Delivered as a turnkey solution, the QL-SpectraCore AmX includes installation, commissioning, comprehensive training, and long-term technical support. This comprehensive package allows laboratories to achieve rapid deployment and sustained analytical performance.
Key Features & Performance
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Elemental range: Carbon (C) to Americium (Am)
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Detection of major, minor, and trace elements (ppm level)
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Fast Silicon Drift Detector (SDD) with Peltier cooling
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Energy resolution ~125 eV for precise peak separation
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Quantitative, semi-quantitative, and qualitative analysis modes
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Rare Earth Element (REE) differentiation and analysis
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Optimized acquisition times for high-throughput workflows
Software, Safety & Operation
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PC-based integrated control and data acquisition software
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Real-time spectral display and live measurement feedback
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Automated background and matrix-effect corrections
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Standardless Fundamental Parameter (FP) calibration
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Fully enclosed, shielded measurement chamber
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Multiple safety interlocks and continuous X-ray monitoring
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User-friendly interface suitable for students to expert analysts













