QL-XRF C15 – Benchtop ED-XRF Spectrometer
A benchtop ED-XRF spectrometer providing precise elemental analysis from C to U, supporting solids, liquids, and powders, with high-resolution SDD detection, automated sample handling, and full IAEA compliance.
OVERVIEW
Description
The QuakeLogic QL-XRF C15 is a high-performance benchtop Energy Dispersive X-Ray Fluorescence (ED-XRF) spectrometer. It is engineered to meet and exceed the IAEA CHI5056 ED-XRF Benchtop Spectrometer Specification. Designed for modern analytical laboratories, the system delivers precise, reliable, and repeatable elemental analysis from Carbon (C) through Uranium (U) across a wide range of sample matrices.
The QL-XRF C15 supports solid materials, liquid samples, loose powders, and pressed powder pellets. It enables laboratories to analyze samples in their optimal physical form with minimal preparation. Its analytical detection range spans from trace-level ppm concentrations to major percentage (%) levels. This allows quantitative, semi-quantitative, and qualitative analysis within a single instrument.
At the core of the system is a thin-window rhodium (Rh) X-ray tube operating up to 50 kV / 15 W. It is coupled with a high-resolution Silicon Drift Detector (SDD) achieving ≤135 eV energy resolution. This configuration обеспечивает excellent spectral separation and accurate peak deconvolution. Furthermore, it provides stable long-term performance. A six-position automated filter system optimizes excitation conditions for different elemental ranges. This improves analytical sensitivity and reproducibility.
The instrument features an automatic sample changer with ten (10) or more positions. It includes a sample spinner for compositional averaging, and flexible measurement atmospheres like air, vacuum, and helium purge to enhance low-Z element detection. A PC-based Windows software platform provides real-time spectral acquisition and advanced data processing. Additionally, it allows quantitative analysis and customizable reporting.
Delivered as a turnkey laboratory solution, the QL-XRF C15 includes delivery and on-site installation. It also covers commissioning and a minimum of two (2) full days of operator training. Fully compliant with IAEA RFQ No. 659190-JMM, the system is a robust, internationally compliant ED-XRF platform. It is suitable for research, quality control, and regulatory laboratories.
Key Features & Capabilities
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Energy Dispersive X-Ray Fluorescence (ED-XRF) technology
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Elemental coverage from Carbon (C) to Uranium (U)
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Quantitative, semi-quantitative, and qualitative analysis
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Supports solid, liquid, loose powder, and pressed powder samples
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High-resolution Silicon Drift Detector (≤135 eV)
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Automated multi-position sample changer
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Sample spinner for improved homogeneity
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Air, vacuum, and helium measurement atmospheres
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IAEA CHI5056 and RFQ-compliant design
Technical Specifications
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X-Ray Tube: Rhodium (Rh), thin window
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Maximum Voltage: 50 kV
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Maximum Power: 15 W
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Maximum Current: 3 mA
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Detector: Silicon Drift Detector (SDD), Be window
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Energy Resolution: ≤135 eV
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Elemental Range: C (Z=6) to U (Z=92)
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Detection Range: ppm to %
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Sample Changer: ≥10 positions
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Measurement Atmospheres: Air, Vacuum, Helium
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Software: PC-based, Windows OS, real-time spectral processing
Installation, Training & Compliance
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Turnkey delivery, installation, and commissioning
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Functional performance verification on site
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Minimum two (2) full days of operator training
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Advanced software training and method development
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Full compliance with IAEA RFQ No. 659190-JMM
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Designed to meet IAEA CHI5056 ED-XRF specifications
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Long-term analytical stability and international data comparability













